doc. no : qw0905- rev. : date : data sheet super bright rectangle type led lamps LVG5230 ligitek electronics co.,ltd. property of ligitek only LVG5230 23 - may - 2005 a
directivity radiation note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. package dimensions ligitek electronics co.,ltd. property of ligitek only part no. page 1/4 LVG5230 ?? 0.5 typ 25.0min 2.54typ 1.0min 5.0 7.0 1.5max 2.0 60 x -60 x 25% 100% 50% 75% 25% 0 100% 50% 75% -30 x 0 x 30 x
color note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. absolute maximum ratings at ta=25 j i fp pd i f tstg t opr tsol esd symbol typical electrical & optical characteristics (ta=25 j ) green diffused gap LVG5230 green material part no emitted power dissipation reverse current @5v electrostatic discharge storage temperature soldering temperature operating temperature parameter peak forward current duty 1/10@10khz forward current part no. typ. 18 luminous intensity @20ma(mcd) 565 30 2.6 1.7 9.0 spectral halfwidth ??f nm peak wave length f pnm lens max. forward voltage @ ma(v) min. 20 min. 110 viewing angle 2 c 1/2 (deg) 100 -40 ~ +100 max 260 j for 5 sec max (2mm from body) -40 ~ +85 ir 2000 10 ratings vg 120 30 mw j v j g a ma ma unit ligitek electronics co.,ltd. property of ligitek only page 2/4 LVG5230
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity@20ma wavelength (nm) forward voltage@20ma normalize @25 j fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity@20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0 10 100 1000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40 -20 0 20 40 60 1.0 1.1 1.2 500 550 600 650 0.0 0.5 1.0 2.0 3.0 4.0 5.0 80 100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 vg chip 3.5 part no. page 3/4 LVG5230
this test intended to see soldering well performed or not. the purpose of this test is the resistance of the device under tropical for hous. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. solderability test 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec high temperature high humidity test thermal shock test solder resistance test the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202:103b jis c 7021: b-11 this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. operating life test 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) high temperature storage test low temperature storage test the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) reliability test: test item test condition description mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reference standard ligitek electronics co.,ltd. property of ligitek only 4/4 page part no. LVG5230
|
